Your Partner in Electronics and Component Reliability
LUT CERES is a center of excellence located at LUT University’s Lappeenranta campus, specializing in reliability testing and research services for companies and academic institutions.
We support our clients throughout the entire testing process, helping them select the most suitable testing and analysis methods while providing expert guidance in interpreting and understanding the results. With our services, no prior expertise in reliability testing is required – we make the process seamless and accessible.
Our services
Environmental and Corrosion Testing for Electronics
LUT has years of experience in environmental and corrosion testing and research for electronics.
We offer a range of services, including:
- Temperature and humidity chamber testing (also known as climate chamber testing)
- Mixed Flowing Gas (MFG) testing – multi-gas corrosion testing in an environmental chamber
- Single-gas corrosion testing in an environmental chamber
- Flowers of sulfur testing (FoS)
During testing, samples can be subjected to voltage, ranging from low voltage to medium voltage levels. Leakage current is continuously monitored throughout the process to ensure accurate results.
Development and Research of Testing Methods
In addition to testing services, we actively contribute to the development of new testing methods.
Currently, we are working on characterizing power semiconductor switches and optimizing power cycling tests for wide-bandgap (WBG) components, such as SiC (silicon carbide) and GaN (gallium nitride).
We have also conducted research on condition monitoring of electronics and defect detection methods in various projects.
Imaging and Analysis Services for the Electronics Industry
To support failure analysis and the interpretation of stress test results, we operate a state-of-the-art laboratory equipped for characterization measurements of electronic components. We can analyze component characteristic curves and track their changes over time.
Our center is equipped with advanced imaging technologies, including:
- Digital microscopy
- X-ray imaging (2D) and CT scanning (3D)
- Scanning electron microscopy (SEM) with elemental analysis (EDS/EDX)
- Ultrasound microscopy (SAM)
These tools enable precise diagnostics and in-depth analysis, helping to ensure the reliability and performance of electronic components.
Inquiries and Contact Information
Or contact us directly:
Tommi Kärkkäinen
History and Mission of LUT CERES
LUT CERES was established in 2024 as part of a development project funded by the Regional Council of South Karelia, the City of Lappeenranta, and LUT University. The initiative stemmed from the needs of the Finnish electronics industry, which required an independent center of expertise in reliability engineering.
Benefits for Companies
- Independent testing laboratory – enhances the credibility of companies' testing activities
- Additional testing capacity – supports in-house testing efforts
- Expertise based on the latest research
- Cost efficiency – companies do not need to invest in the same testing equipment individually
- Reduced competition for specialized experts
LUT CERES provides companies with cutting-edge reliability testing and research, strengthening the industry’s ability to develop durable and high-quality electronic components.